Kishor S. Trivedi
Hudson Professor of Electrical and Computer Engineering, in the Edmund T. Pratt, Jr. School of Engineering
Kishor S. Trivedi holds the Hudson Chair in the Department of Electrical and Computer Engineering at Duke University, Durham, NC. He has been on the Duke faculty since 1975. He is the author of a well known text entitled, Probability and Statistics with Reliability, Queuing and Computer Science Applications, published by Prentice-Hall; a thoroughly revised second edition (including its Indian edition) of this book has been published by John Wiley. A comprehensive solution manual for the second edition containing more than 300 problem solutions is now available from the publisher (John Wiley). He has also published two other books entitled, Performance and Reliability Analysis of Computer Systems, published by Kluwer Academic Publishers and Queueing Networks and Markov Chains,John Wiley. He is a Fellow of the Institute of Electrical and Electronics Engineers. He is a Golden Core Member of IEEE Computer Society. He has published over 420 articles and has supervised 45 Ph.D. dissertations. He is on the editorial boards of IEEE Transactions on dependable and secure computing, Journal of risk and reliability, international journal of performability engineering and international journal of quality and safety engineering. He is a co-designer of HARP, SAVE, SHARPE, SPNP, and SREPT modeling packages. These packages have been widely circulated. He has edited two books, Advanced Computer System Design, published by Gordon and Breach Science Publishers, and Performability Modeling Tools and Techniques, published by John Wiley & Sons. His research interests are in reliability and performance assessment of computer and communication systems.
Recent research accomplishments include three areas of activity: Advances in modeling techniques; performance, reliability and dependability modeling of applications; and development and dissemination of modeling tools. Kishor and his colleagues have developed polynomial time algorithms for performability analysis, numerical solution techniques for completion time problems, algorithms for the numerical solution of the response time distribution in a closed queueing network, techniques to solve large and stiff Markov chains, and algorithms for the automated generation and solution of stochastic reward nets including sensitivity and transient analysis. His group has also developed fast algorithms for the solution of large fault trees and reliability graphs including multistate components and phase mission systems analysis. His group has developed new formalisms of fluid stochastic Petri nets and Markov regenerative stochastic Petri nets. His group has developed many tools - SHARPE, SPNP and SREPT - which have been used at over 500 academic and industrial laboratories. The graphical user-interfaces for these tools have been recently developed. These tools also form the core of BOEING's integrated reliability analysis package. Kishor's group has been in the forefront of the development of fundamentals of software aging and rejuvenation. His group is also very active in software reliability.
Dr. Trivedi has recently developed solution methods for Markov regenerative processes and used it for performance and reliability analysis. He has applied his modeling techniques to a variety of "real world'' applications including: performance analysis of polling systems and client-server systems, wireless hand-off, connection admission control in CDMA systems, reliability analysis of RAID, reliability analysis of FDDI token rings, availability analysis of Vaxcluster systems, transient performance analysis of leaky bucket rate control scheme, and to the analysis of real-time systems. His methods of software rejuvenation have been implemented in the IBM x series servers. Trivedi worked with IBM engineers to develop a reliability model of the SIP protocol running on High Availability WebSphere. Trivedi and his student worked with Boeing for the reliability analysis of Boeing 787 Current Return Network for the purpose of certification by FAA. They have developed a new algorithm for the network reliability bounds analysis.
Appointments and Affiliations
- Hudson Professor of Electrical and Computer Engineering, in the Edmund T. Pratt, Jr. School of Engineering
- Professor of Electrical and Computer Engineering
- Office Location: Science Drive, 203 Hudson Eng Ctr, Durham, NC 27708-0291
- Office Phone: (919) 660-5269
- Web Page:
- Ph.D. University of Illinois, 1974
- M.S. University of Illinois, 1972
- B.S.E.E. Indian Institute Of Technology (India), 1968
Awards, Honors, and Distinctions:
- Fellow, IEEE
- COMPSCI 555: Probability for Electrical and Computer Engineers
- ECE 555: Probability for Electrical and Computer Engineers
- ECE 557: Performance and Reliability of Computer Networks
- ECE 899: Special Readings in Electrical Engineering
Representative Publications: (More Publications)
- Zhao, J; Jin, Y; Trivedi, KS; Jr., RM; Wang, Y, Software rejuvenation scheduling using accelerated life testing, ACM Journal on Emerging Technologies in Computing Systems, vol 10 no. 1 (2014), pp. 1-23 [10.1145/2539118] [abs].
- Araujo, J; Matos, R; Alves, V; Maciel, P; Souza, FVD; Jr., RM; Trivedi, KS, Software aging in the eucalyptus cloud computing infrastructure, ACM Journal on Emerging Technologies in Computing Systems, vol 10 no. 1 (2014), pp. 1-22 [10.1145/2539122] [abs].
- Machida, F; Nicola, VF; Trivedi, KS, Job completion time on a virtualized server with software rejuvenation, ACM Journal on Emerging Technologies in Computing Systems, vol 10 no. 1 (2014), pp. 1-26 [10.1145/2539121] [abs].
- Yin, X; Ma, X; Trivedi, KS, MAC and application level performance evaluation of beacon message dissemination in DSRC safety communication, Performance Evaluation, vol 71 (2014), pp. 1-24 [abs].
- Guida, M; Longo, M; Postiglione, F; Trivedi, KS; Yin, X, Semi-Markov models for performance evaluation of failure-prone IP multimedia subsystem core networks, Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability, vol 227 no. 3 (2013), pp. 290-301 [10.1177/1748006X13485191] [abs].