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Publications by Sule Ozev

Papers Published

  1. Acar, Erkan and Ozev, Sule, Go/No-Go testing of VCO modulation RF transceivers through the delayed-RF setup, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, (2007), 37 - 46, [TVLSI.2007.891082], [abs]
  2. Fang Liu and Nikolov, P.K. and Ozev, S., Parametric fault diagnosis for analog circuits using a Bayesian framework, Proceedings. 24th IEEE VLSI Test Symposium, (2006), 6 pp. -, [abs]
  3. Bower, Fred A. and Hower, Derek and Yilmaz, Mahmut and Sorin, Daniel J. and Ozev, Sule, Applying architectural vulnerability analysis to hard faults in the microprocessor, Performance Evaluation Review, (2006), 375 - 376, [abs]
  4. Bower, F.A. and Sorin, D.J. and Ozev, S., A mechanism for online diagnosis of hard faults in microprocessors, Proceedings. 38th Annual IEEE/ACM International Symposium on Microarchitecture, (2006), 12 pp. -, [abs]
  5. Erdogan, E.S. and Ozev, S., A robust, self-tuning CMOS circuit for built-in go/no-go testing of synthesizer phase noise, 2006 IEEE International Test Conference, (2006), 10 pp. -, [abs]
  6. Yilmaz, M. and Hower, D.R. and Ozev, S. and Sorin, D.J., Self-checking and self-diagnosing 32-bit microprocessor multiplier, 2006 IEEE International Test Conference, (2006), 10 pp. -, [abs]
  7. Acar, E. and Ozev, S., Defect-based RF testing using a new catastrophic fault model, 2005 IEEE International Test Conference (IEEE Cat. No.05CH37661C), (2006), 9 pp. -, [abs]
  8. Liu, Fang and Ozev, Sule and Brooke, Martin, Identifying the source of BW failures in high-frequency linear analog circuits based on S-parameter measurements, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, (2006), 2594 - 2605, [TCAD.2006.871619], [abs]
  9. Su, Fei and Ozev, Sule and Chakrabarty, Krishnendu, Test planning and test resource optimization For droplet-based microfluidic systems, Journal of Electronic Testing: Theory and Applications (JETTA), (2006), 199 - 210, [s10836-005-1256-3], [abs]
  10. Fei Su and Ozev, S. and Chakrabarty, K., Concurrent testing of digital microfluidics-based biochips, ACM Trans. Des. Autom. Electron. Syst. (USA), (2006), 442 - 64, [1142155.1142164], [abs]
  11. Sehgal, A. and Ozev, S. and Chakrabarty, K., Test infrastructure design for mixed-signal SOCs with wrapped analog cores, IEEE Trans. Very Large Scale Integr. (VLSI) Syst. (USA), (2006), 292 - 304, [TVLSI.2006.871758], [abs]
  12. Carter, Jonathan R. and Ozev, Sule and Sorin, Daniel J., Circuit-level modeling for concurrent testing of operational defects due to gate oxide breakdown, Proceedings -Design, Automation and Test in Europe, DATE '05, (2005), 300 - 305, [94], [abs]
  13. Liu, Fang and Ozev, Sule, Fast hierarchical process variability analysis and parametric test development for analog/RF circuits, Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors, (2005), 161 - 168, [54], [abs]
  14. Bower, Fred A. and Ozev, Sule and Sorin, Daniel J., Autonomic microprocessor execution via self-repairing arrays, IEEE Transactions on Dependable and Secure Computing, (2005), 297 - 310, [44], [abs]
  15. Su, Fei and Ozev, Sule and Chakrabarty, Krishnendu, Ensuring the operational health of droplet-based microelectrofluidic biosensor systems, IEEE Sensors Journal, (2005), 763 - 772, [JSEN.2005.848127], [abs]
  16. Acar, E. and Ozev, S., Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions, ICCAD-2005 International Conference on Computer Aided Design (IEEE Cat. No. 05CH37700), (2005), 73 - 9, [abs]
  17. Liu, Fang and Flomenberg, Jacob J. and Yasaratne, Devaka V. and Ozev, Sule, Hierarchical variance analysis for analog circuits based on graph modelling and correlation loop tracing, Proceedings -Design, Automation and Test in Europe, DATE '05, (2005), 126 - 131, [175], [abs]
  18. Sehgal, A. and Ozev, S. and Chakrabarty, K., A flexible design methodology for analog test wrappers in mixed-signal SOCs, Proceedings. 2005 International Conference on Computer Design, (2005), 137 - 42, [abs]
  19. Carter, J.R. and Ozev, S. and Sorin, D.J., Circuit-level modeling for concurrent testing of operational defects due to gate oxide breakdown, Proceedings. Design, Automation and Test in Europe, (2005), 300 - 5, [abs]
  20. Acar, Erkan and Ozev, Sule, Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions, IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD, (2005), 73 - 79, [ICCAD.2005.1560043], [abs]
  21. Acar, E. and Ozev, S., Diagnosis of the failing component in RF receivers through adaptive full-path measurements, Proceedings. 23rd IEEE VLSI Test Symposium, (2005), 374 - 9, [abs]
  22. Sehgal, Anuja and Ozev, Sule and Chakrabarty, Krishnendu, A flexible design methodology for analog test wrappers in mixed-signal SOCs, Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors, (2005), 137 - 142, [8], [abs]
  23. Fang Liu and Ozev, S., Hierarchical analysis of process variation for mixed-signal systems, Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference 2005 (IEEE Cat. No.05EX950C), (2005), 465 - 70, [abs]
  24. Acar, Erkan and Ozev, Sule, Defect-based RF testing using a new catastrophic fault model, Proceedings - International Test Conference, (2005), 421 - 429, [TEST.2005.1584001], [abs]
  25. Sehgal, Anuja and Liu, Fang and Ozev, Sule and Chakrabarty, Krishnendu, Test planning for mixed-signal SOCs with wrapped analog cores, Proceedings -Design, Automation and Test in Europe, DATE '05, (2005), 50 - 55, [303], [abs]
  26. Ozev, S. and Orailoglu, A., End-to-end testability analysis and DfT insertion for mixed-signal paths, Proceedings. IEEE International Conference on Computer Design: VLSI in Computers and Processors, (2004), 72 - 7, [abs]
  27. Acar, E. and Ozev, S., Delayed-RF based test development for FM transceivers using signature analysis, Proceedings. International Test Conference 2004 (IEEE Cat. No.04CH37586), (2004), 783 - 92, [abs]
  28. Ozev, Sule and Bayraktaroglu, Ismet and Orailoglu, Alex, Seamless Test of Digital Components in Mixed-Signal Paths, IEEE Design and Test of Computers, (2004), 44 - 55, [MDT.2004.1261849], [abs]
  29. Su, Fei and Ozev, Sule and Chakrabarty, Krishnendu, Concurrent testing of droplet-based microfluidic systems for multiplexed biomedical assays, Proceedings - International Test Conference, (2004), 883 - 892, [abs]
  30. Ozev, Sule and Olgaard, Christian, Wafer-level RF test and DfT for VCO modulating transceiver architecures, Proceedings of the IEEE VLSI Test Symposium, (2004), 217 - 222, [VTEST.2004.1299246], [abs]
  31. Ozev, Sule and Orailoglu, Alex, End-to-end testability analysis and DfT insertion for mixed-signal paths, Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors, (2004), 72 - 77, [abs]
  32. Ozev, Sule and Orailoglu, Alex, Design of concurrent test hardware for linear analog circuits with constrained hardware overhead, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, (2004), 756 - 765, [TVLSI.2004.827597], [abs]
  33. Fang Liu and Ozev, S. and Brooke, M., Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search, ICCAD 2004. International Conference on Computer Aided Design (IEEE Cat. No.04CH37606), (2004), 641 - 7, [abs]
  34. Bower, F.A. and Shealy, P.G. and Ozev, S. and Sorin, D.J., Tolerating hard faults in microprocessor array structures, 2004 International Conference on Dependable Systems and Networks, (2004), 51 - 60, [abs]
  35. Acar, Erkan and Ozev, Sule, Delayed-RF based test development for FM transceivers using signature Analysis, Proceedings - International Test Conference, (2004), 783 - 792, [abs]
  36. Bower, Fred A. and Shealy, Paul G. and Ozev, Sule and Sorin, Daniel J., Tolerating hard faults in microprocessor array structures, Proceedings of the International Conference on Dependable Systems and Networks, (2004), 51 - 60, [abs]
  37. Sehgal, A. and Ozev, S. and Chakrabarty, K., TAM optimization for mixed-signal SOCs using analog test wrappers, ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486), (2003), 95 - 9, [abs]
  38. Su, F. and Ozev, S. and Chakrabarty, K., Testing of droplet-based microelectrofluidic systems, Proceedings. International Test Conference 2003 (IEEE Cat. No.03CH37494), (2003), 1192 - 200, [abs]
  39. Ozev, Sule and Orailoglu, Alex, Automated system-level test development for mixed-signal circuits, Analog Integrated Circuits and Signal Processing, (2003), 169 - 178, [A:1024130616851], [abs]
  40. Sehgal, Anuja and Ozev, Sule and Chakrabarty, Krishnendu, TAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers, IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, (2003), 95 - 99, [abs]
  41. Ozev, Sule and Orailoglu, Alex, Statistical tolerance analysis for assured analog test coverage, Journal of Electronic Testing: Theory and Applications (JETTA), (2003), 173 - 182, [A:1022893724851], [abs]
  42. Su, Fei and Ozev, Sule and Chakrabarty, Krishnendu, Testing of Droplet-Based Microelectrofluidic Systems, IEEE International Test Conference (TC), (2003), 1192 - 1200, [abs]
  43. Ozev, Sule and Orailoglu, Alex, Cost-effective concurrent test hardware design for linear analog circuits, Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors, (2002), 258 - 264, [ICCD.2002.1106779], [abs]
  44. Ozev, S. and Orailoglu, A., An integrated tool for analog test generation and fault simulation, Proceedings International Symposium on Quality Electronic Design, (2002), 267 - 72, [ISQED.2002.996748], [abs]
  45. Ozev, Sule and Orailoglu, Alex and Haggag, Hosam, Automated test development and test time reduction for RF subsystems, Proceedings - IEEE International Symposium on Circuits and Systems, (2002), 581-584 -, [ISCAS.2002.1009907], [abs]
  46. Ozev, S. and Orailoglu, A., Boosting the accuracy of analog test coverage computation through statistical tolerance analysis, Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), (2002), 213 - 19, [VTS.2002.1011141], [abs]
  47. Ozev, Sule and Orailoglu, Alex and Olgaard, Christian V., Multilevel testability analysis and solutions for integrated bluetooth transceivers, IEEE Design and Test of Computers, (2002), 82 - 91, [MDT.2002.1033796], [abs]
  48. Ozev, S. and Orailoglu, A., System-level test synthesis for mixed-signal designs, IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, (2001), 588 - 599, [82.943329], [abs]
  49. Ozev, Sule and Olgaard, Christian and Orailoglu, Alex, Testability implications in low-cost integrated radio transceivers: A Bluetooth case study, IEEE International Test Conference (TC), (2001), 965 - 974, [TEST.2001.966721], [abs]
  50. Ozev, S. and Orailoglu, A., Path-based test composition for mixed-signal SOC's, 2000 Southwest Symposium on Mixed-Signal Design (Cat. No.00EX390), (2000), 153 - 8, [SSMSD.2000.836464], [abs]
  51. Ozev, S. and Bayraktaroglu, I. and Orailogiu, A., Test synthesis for mixed-signal SOC paths, Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537), (2000), 128 - 33, [DATE.2000.840028], [abs]
  52. Ozev, Sule and Orailoglu, Alex, Test selection based on high level fault simulation for mixed-signal systems, Proceedings of the IEEE VLSI Test Symposium, (2000), 149 - 154, [VTEST.2000.843839], [abs]
  53. Ozev, Sule and Orailoglu, Alex, Low-cost test for large analog IC's, IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, (1999), 101 - 109, [DFTVS.1999.802875], [abs]
  54. Ozev, S. and Altinordu, A. and Dundar, G., Implementation of a radix 2<sup>n</sup> multiplier using high performance logic, Proceedings of the Mediterranean Electrotechnical Conference - MELECON, (1996), 469 - 472, [MELCON.1996.551581], [abs]