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Sule Ozev

Sule Ozev received her B.S. degree in Electrical Engineering from Bogazici University, Turkey, and her M.S. and Ph.D. degrees in Computer Science and Engineering from University of California, San Diego in 1995, 1998, and 2002 respectively. Dr. Ozev is an assistant professor at the Electrical and Computer Engineering Department at Duke University. Her research interests include system-level test methods for mixed-signal and RF circuits, computer-aided-analysis of high-level and transistor-level circuits, and device modeling.

Contact Information:
Education:
PhDUniversity of California, San Diego2002
MSUniversity of California, San Diego1998
BSBogazici University1995
Research Interests:

Dr. Ozev primarily focuses on the low-cost manufacturing of wireless communications systems.

Specialties:

Computer Engineering
Nanoscale/microscale computing systems
Failure Analysis
Analog and Power Electronics
Electronic Circuit Assembly and Testing

Awards, Honors, and Distinctions:

  • Best Paper Award, ICCD, 2005
  • Flaviu Christian Research Award, University of California, San Diego, 1999-2001
  • IBM Austin Center for Advanced Studies Faculty Award, 2006-2007
  • IBM Corporation Co-operative Fellowship Award, 2000-2001
  • NSF Early CAREER Award, National Science Foundation, 2006
  • TTTC Naveena Nagi Award, IEEE VLSI Test Symposium, 2002

Representative Publications: (More Publications)
  1. Acar, Erkan and Ozev, Sule, Go/No-Go testing of VCO modulation RF transceivers through the delayed-RF setup, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol 15 no. 1 (2007), pp. 37 - 46 [TVLSI.2007.891082] [abs]
  2. Fang Liu and Nikolov, P.K. and Ozev, S., Parametric fault diagnosis for analog circuits using a Bayesian framework, Proceedings. 24th IEEE VLSI Test Symposium (2006), pp. 6 pp. - [abs]
  3. Bower, Fred A. and Hower, Derek and Yilmaz, Mahmut and Sorin, Daniel J. and Ozev, Sule, Applying architectural vulnerability analysis to hard faults in the microprocessor, Performance Evaluation Review, vol 34 no. 1 (2006), pp. 375 - 376 [abs]
  4. Bower, F.A. and Sorin, D.J. and Ozev, S., A mechanism for online diagnosis of hard faults in microprocessors, Proceedings. 38th Annual IEEE/ACM International Symposium on Microarchitecture (2006), pp. 12 pp. - [abs]
  5. Erdogan, E.S. and Ozev, S., A robust, self-tuning CMOS circuit for built-in go/no-go testing of synthesizer phase noise, 2006 IEEE International Test Conference (2006), pp. 10 pp. - [abs]