Pratt School of Engineering

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Daniel J Sorin

Dr. Daniel Sorin is an associate professor of Electrical and Computer Engineering and of Computer Science. His research interests are primarily in computer architecture and dependability.

Contact Information:
Education:
PhDUniversity of Wisconsin - Madison2002
MSUniversity of Wisconsin - Madison1998
BSDuke University1996
Research Interests:

The primary focus of my research is computer architecture. This research includes work to: improve the dependability of computer architectures, design microarchitectures such that their designs are easier to validate, and develop memory system designs for multicore processors.

Specialties:

Computer Engineering
Computer Architecture
Fault Tolerance
Reliability

Awards, Honors, and Distinctions:

  • Eta Kappa Nu
  • Intel Graduate Fellowship
  • NSF Early CAREER Award, National Science Foundation, 2005
  • Outstanding Graduate Research Award, University of Wisconsin
  • Phi Beta Kappa
  • Tau Beta Pi
  • Top of 2004 - Nanocomputing Research, Technology Research News

Courses Taught:
  • ECE 152 - COMPUTER ARCHITECTURE (Synopsis)

Representative Publications: (More Publications)
  1. Meixner, A. and Sorin, D.J., Dynamic verification of memory consistency in cache-coherent multithreaded computer architectures, 2006 International Conference on Dependable Systems and Networks (2006), pp. 10 pp. - [abs]
  2. Bower, F.A. and Sorin, D.J. and Ozev, S., A mechanism for online diagnosis of hard faults in microprocessors, Proceedings. 38th Annual IEEE/ACM International Symposium on Microarchitecture (2006), pp. 12 pp. - [abs]
  3. Meixner, A. and Sorin, D.J., Dynamic verification of sequential consistency, Proceedings. 32nd International Symposium on Computer Architecture (2005), pp. 482 - 93 [abs]
  4. Dwyer, C. and Lebeck, A.R. and Sorin, D.J., Self-assembled architectures and the temporal aspects of computing, Computer (USA), vol 38 no. 1 (2005), pp. 56 - 64 [34] [abs]
  5. Li, T. and Lebeck, A.R. and Sorin, D.J., Spin detection hardware for improved management of multithreaded systems, IEEE Trans. Parallel Distrib. Syst. (USA), vol 17 no. 6 (2006), pp. 508 - 21 [78] [abs]
  6. Carter, J.R. and Ozev, S. and Sorin, D.J., Circuit-level modeling for concurrent testing of operational defects due to gate oxide breakdown, Proceedings. Design, Automation and Test in Europe, vol Vol. 1 (2005), pp. 300 - 5 [abs]
  7. Bower, F.A. and Shealy, P.G. and Ozev, S. and Sorin, D.J., Tolerating hard faults in microprocessor array structures, 2004 International Conference on Dependable Systems and Networks (2004), pp. 51 - 60 [abs]
  8. Sorin, D.J. and Martin, M.M.K. and Hill, M.D. and Wood, D.A., SafetyNet: improving the availability of shared memory multiprocessors with global checkpoint/recovery, Proceedings 29th Annual International Symposium on Computer Architecture (2002), pp. 123 - 34 [ISCA.2002.1003568] [abs]